Experimental measurements and numerical simulation of permittivity and permeability of Teflon in X band

Paula, Adriano Luiz de; Rezende, Mirabel Cerqueira; Barroso, Joaquim José

doi:10.5028/jatm.2011.03019410

Abstract

Recognizing the importance of an adequate characterization of radar absorbing materials, and consequently their development, the present study aims to contribute for the establishment and validation of experimental determination and numerical simulation of electromagnetic materials complex permittivity and permeability, using a Teflon^® sample. The present paper branches out into two related topics. The first one is concerned about the implementation of a computational modeling to predict the behavior of electromagnetic materials in confined environment by using electromagnetic three-dimensional simulation. The second topic re-examines the Nicolson-Ross-Weir mathematical model to retrieve the constitutive parameters (complex permittivity and permeability) of a homogeneous sample (Teflon^®), from scattering coefficient measurements. The experimental and simulated results show a good convergence that guarantees the application of the used methodologies for the characterization of different radar absorbing materials samples.

Keywords:
Electric permittivity; Magnetic permeability; Radar absorbing material; Computational modeling

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REFERENCES

Agilent Technologies, "Measuring the dielectric constant of solids with the HP 8510 network analyzer", Technical Overview 5954-1535.USA, 10p., 1985.
American Society for Testing and Materials, "ASTM D5568-1: Standard Test Method for measuring Relative Complex permittivity and Relative Magnetic Permeability of Solid Materials at Microwave Frequencies", West Conshohoken, PA: ASTM, 2001.
Baker-Jarvis, J., Janezic, M. D., Grasvenor Jr., J. H., and Geyer, R. G., "Transmission/Reflection and Short-Circuit Line of Methods for Measuring Permittivity and Permeability", NIST Technical Note 1355-R, Colorado, 1993, from http://whites.sdsmt.edu/classes/ee692gwmm/additional/NIST_Tech_Note_1355-R.pdf
» http://whites.sdsmt.edu/classes/ee692gwmm/additional/NIST_Tech_Note_1355-R.pdf
Chung, B. K., "Dielectric constant measurement for thin material at microwave frequency", Progress in Electromagnetics Research,Vol., No. 75, pp. 239-252, 2007.
CST MICROWAVE STUDIO. Version 3 Getting Started, Jan.2001, CST Computer B.-K Chung, "Dielectric constant measurement for thin material at microwave Simulation Technology".
De Paula, A. L., Rezende, M. C., Barroso, J. J., Pereira, J. J. and Nohara E. L., "Comparative Study of S parameters of the Teflon^® obtained experimentally and by Electromagnetic Simulation", Symposium on Operating Systems Application Areas of Defense, São José dos Campos, Brazil, 2008.
Nicolson, A. M., Ross, G. F., "Measurement of the Intrinsic Properties of Materials by Time Domain Techniques", Instrumentantion and Measurement, Vol. 19, pp.377-382, 1970. doi: 10.1109/TIM.1970.4313932
» https://doi.org/10.1109/TIM.1970.4313932
Weir, W.B., "Automatic Measurement of Complex Dielectric Constant and Permeability at Microwave Frequencies", Proceedings of the IEEE, Vol. 62, pp. 33-36, 1974.

Publication Dates

Publication in this collection
Jan-Apr 2011

History

Received
06 Nov 2010
Accepted
11 Nov 2010

This is an Open Access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

[1] Agilent Technologies, "Measuring the dielectric constant of solids with the HP 8510 network analyzer", Technical Overview 5954-1535.USA, 10p., 1985.

[2] American Society for Testing and Materials, "ASTM D5568-1: Standard Test Method for measuring Relative Complex permittivity and Relative Magnetic Permeability of Solid Materials at Microwave Frequencies", West Conshohoken, PA: ASTM, 2001.

[3] Baker-Jarvis, J., Janezic, M. D., Grasvenor Jr., J. H., and Geyer, R. G., "Transmission/Reflection and Short-Circuit Line of Methods for Measuring Permittivity and Permeability", NIST Technical Note 1355-R, Colorado, 1993, from http://whites.sdsmt.edu/classes/ee692gwmm/additional/NIST_Tech_Note_1355-R.pdf
» http://whites.sdsmt.edu/classes/ee692gwmm/additional/NIST_Tech_Note_1355-R.pdf

[4] Chung, B. K., "Dielectric constant measurement for thin material at microwave frequency", Progress in Electromagnetics Research,Vol., No. 75, pp. 239-252, 2007.

[5] CST MICROWAVE STUDIO. Version 3 Getting Started, Jan.2001, CST Computer B.-K Chung, "Dielectric constant measurement for thin material at microwave Simulation Technology".

[6] De Paula, A. L., Rezende, M. C., Barroso, J. J., Pereira, J. J. and Nohara E. L., "Comparative Study of S parameters of the Teflon^® obtained experimentally and by Electromagnetic Simulation", Symposium on Operating Systems Application Areas of Defense, São José dos Campos, Brazil, 2008.

[7] Nicolson, A. M., Ross, G. F., "Measurement of the Intrinsic Properties of Materials by Time Domain Techniques", Instrumentantion and Measurement, Vol. 19, pp.377-382, 1970. doi: 10.1109/TIM.1970.4313932
» https://doi.org/10.1109/TIM.1970.4313932

[8] Weir, W.B., "Automatic Measurement of Complex Dielectric Constant and Permeability at Microwave Frequencies", Proceedings of the IEEE, Vol. 62, pp. 33-36, 1974.

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