Process capability indices have become popular tools to describe how well a process can meet specified tolerances. However, little attention has been given to the study of these indices when the specified tolerances are one-sided. In this work we present an index for such situations. The proposed index is invariant with respect to process fraction non-conforming and it is "Cpk calibrated". Bayesian inference procedure under a binomial sampling is also developed and described for the proposed index.
Process capability indices; Non-conforming fraction; One-sided specification limit; Bayesian analysis
